90-94

INFLUENCE OF X-RADIATION ON STRUCTURE OF DNA OF YEASTS C. guilliermondii NP-4

Investigation of fluorescence, electrophoretic and melting parameters of DNA of yeasts Candida guilliermondii NP-4 after X-radiation and posradiation repair was carried out. It was shown that under influence of X-radiation the rate of saturation of DNA by ethidium bromide and the melting temperature of yeast DNA was increased, and the melting interval was de-creased. After repair period the rate of saturation of DNA by ethidium bromide and the melting temperature of yeast DNA were the highest, and the melting interval was the lowest, and in the electrophoregramms or repaired DNA there were additional low molecular fractions which tes-tify about possible changes in DNA primary and secondary structures under influence of X-radiation and postradiation repair.

Key words: yeasts, DNA, X- ray radiation, repair, fluorescence, electrophorezis, DNA melting

2016, Т. 59, № 3, Стр. 90-94